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Bangalore, Oct. 15 Chip design software maker Magma Design Automation unveiled on Monday automatic test pattern generation (ATPG) products that help test engineers.

The increased complexity and smaller feature sizes of today’s chip designs make it more complicated to test manufactured ICs. Quality testing now requires the use of more fault models and importing of data from other design tools, which can cause more errors to creep in.

Designed to concurrently target multiple fault models, Talus ATPG allows designers to improve test quality and turnaround time. It is fully integrated into Magma’s Talus IC implementation system and leverages the unified data model architecture to efficiently access timing, layout, power and other design data that is not available to other ATPG tools. Magma will be highlighting Talus ATPG and Talus ATPG-X at the International Test Conference on October 23-25 in Santa Clara.

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